Structural and Dielectric Characterization of La Modified PZT (52/48) Nano Ceramic Material for Electronic Applications

Abstract

The objective of the presented work is to investigate the effects of varying concentration of La as hard dopant on structural, morphological and dielectric properties of lead zirconium titanate (PZT). The base material PZT was prepared by sol-gel technique on lab scale to reduce the injection of sintering defects. After addition of varying weight percentage of La, the different composite materials were analyzed under scanning electron microscope to study the structural modifications taking place. X-Ray diffraction patterns were studied in combination with variation of dielectric constant with temperature and frequency. it is observed that a single phase perovskite structure with tetragonal phase is formed for all compositions of PLZT. The dielectric constant of undoped PZT is found to be 11,300 at a temperature of 500OC and frequency of 100Hz. The results further indicate that the dielectric properties of the pure-phase PZT are better than La doped PZT at higher temperature.